Keithley 2657A High Power System SourceMeter Instrument

Key Features At A Glance

• Source or sink up to 180W of DC or pulsed power (±3000V at 20mA, ±1500V at 120mA)
• 1 fA low current resolution for precision low-level measurement
• Dual 22-bit precision integrating ADCs and dual 18-bit digitizers sampling at 1 µs per point
• Four-quadrant operation as source or sink across the full ±3000V envelope
• TSP-Link expansion to integrate up to 32 nodes with other Series 2600A instruments
• Combines precision power supply, current source, DMM, waveform generator, pulse generator, electronic load, and trigger controller in one instrument
• LXI Class C compliant with IEEE-488, Ethernet, RS-232, and 14 digital I/O lines for system integration
• Includes TSP Express characterization software, LabVIEW driver, and Test Script Builder development environment

The Keithley 2657A is a high voltage, high power, low current source measurement unit (SMU) instrument designed for characterizing and testing high voltage electronics and power semiconductors, including diodes, FETs, and IGBTs, as well as other components and materials in which high voltage, fast response, and precise measurements of voltage and current are required. It is part of the Series 2600A family of power semiconductor characterization and test solutions and offers high power output and low current measurement performance in a single SMU platform.

Applications for the 2657A include power semiconductor device characterization and testing, characterization of GaN, SiC, and other compound materials and devices, breakdown and leakage testing up to 3kV, and characterization of sub-millisecond transients. The instrument operates as a semiconductor characterization tool, a V or I waveform generator, a V or I pulse generator, a precision power supply with V and I readback, a true current source, a digital multimeter with 6½-digit resolution for DCV, DCI, ohms, and power, and a precision electronic load.

ValueTronics International has supplied the test and measurement community with new and pre-owned precision instrumentation since 1992. Every SMU and high-power source-measure instrument that moves through our inventory passes inspection and performance verification at our 20,000 square foot secure facility at 1675 Cambridge Drive in Elgin, Illinois before it ships, which is the practical difference between a verified instrument and a marketplace listing. That direct technical involvement is also why customers come back to ValueTronics for the next SMU, the next characterization system, and the trade-in conversation that funds it.

Brand Heritage

Keithley Instruments was founded in 1946 in Cleveland, Ohio and built its reputation around precision low-level electrical measurement. Keithley was acquired by Danaher Corporation in 2010, joining Tektronix in the same instrument portfolio. In 2016, Danaher's industrial instrumentation businesses, including both Keithley and Tektronix, were spun off into Fortive Corporation, where the Keithley brand and product lines continue today.

Accessories Supplied

• 7709-308A Digital I/O and Interlock Connector
• CA-180-3A TSP-Link/Ethernet Cable
• Documentation CD
• Software tools and drivers CD

Product Core & Specifications

Voltage Accuracy Specifications
Range	Source Programming Resolution	Source Accuracy ±(% rdg + volts)	Display Resolution	Integrating ADC Measure Accuracy ±(% rdg + volts)	High Speed ADC Measure Accuracy ±(% rdg + volts)
200 V	5 mV	0.03% + 50 mV	100 µV	0.025% + 50 mV	0.05% + 100 mV
500 V	10 mV	0.03% + 125 mV	100 µV	0.025% + 100 mV	0.05% + 200 mV
1500 V	40 mV	0.03% + 375 mV	1 mV	0.025% + 300 mV	0.05% + 600 mV
3000 V	80 mV	0.03% + 750 mV	1 mV	0.025% + 600 mV	0.05% + 1.2 V

Current Accuracy Specifications
Range	Source Programming Resolution	Source Accuracy ±(% rdg + amps)	Display Resolution	Integrating ADC Measure Accuracy ±(% rdg + amps)	High Speed ADC Measure Accuracy ±(% rdg + amps)
1 nA	30 fA	0.1% + 2E−12 + VoE−15	1 fA	0.1% + 6E−13 + VoE−15	0.2% + 6E−13 + VoE−15
10 nA	300 fA	0.1% + 5E−12 + VoE−15	10 fA	0.1% + 5E−12 + VoE−15	0.2% + 5E−12 + VoE−15
100 nA	3 pA	0.1% + 6E−11 + VoE−13	100 fA	0.1% + 6E−11 + VoE−13	0.2% + 6E−11 + VoE−13
1 µA	30 pA	0.03% + 700 pA	1 pA	0.025% + 400 pA	0.08% + 800 nA
10 µA	300 pA	0.03% + 5 nA	10 pA	0.025% + 1.5 nA	0.08% + 3 nA
100 µA	3 nA	0.03% + 60 nA	100 pA	0.02% + 25 nA	0.05% + 50 nA
1 mA	30 nA	0.03% + 300 nA	1 nA	0.02% + 200 nA	0.05% + 400 nA
2 mA	60 nA	0.03% + 1.2 µA	1 nA	0.02% + 500 nA	0.05% + 1 µA
20 mA	600 nA	0.03% + 12 µA	10 nA	0.02% + 5 µA	0.05% + 10 µA
120 mA	3 µA	0.03% + 36 µA	100 nA	0.02% + 24 µA	0.05% + 50 µA

Supplemental Characteristics
Typical Voltage Source Noise	0.005% of range
Typical Current Source Noise	0.08% of range
Typical Voltage Source Settling	<1 ms to 200 V, <7 ms to 3000 V
Typical Current Source Settling	<5 ms to 120 mA, <200 ms to 1 µA

Power Output
Maximum DC or Pulsed Power	180 W (±3000 V @ 20 mA, ±1500 V @ 120 mA)
Low Current Resolution	1 fA
ADC — Integrating	Dual 22-bit precision ADCs
ADC — High Speed Digitizer	Dual 18-bit, 1 µs per point

Triggering and Synchronization
Triggering: Trigger In to Trigger Out	0.5 µs, typical
Synchronization (single- or multi-node synchronized source change)	<0.5 µs, typical

Programming & Software Interface
Test Script Builder	Integrated development environment for building, running, and managing TSP scripts
TSP Express (Embedded)	Tool to perform common I-V tests quickly and easily without programming or installing software
Software Interface	TSP Express (Embedded), Direct GPIB/VISA, Read/Write with VB, VC/C++, VC#, LabVIEW, TestPoint, LabWindows/CVI, etc.

General
USB	USB 2.1 Host Controller, supports external data storage
Contact Check	±50 Ω
PC Interface	IEEE-488.1 and .2; LXI Class C Ethernet; RS-232
Digital I/O Interface	Input/Output Pins: 14 open drain I/O bits, 5.25 V max
Power Supply	100 V to 250 VAC, 50 Hz–60 Hz (auto sensing), 550 VA max
Cooling	Forced air. Side and top intake and rear exhaust
EMC	Conforms to European Union EMC Directive
Safety	ETL listed (PENDING). Conforms to European Union Low Voltage Directive
Warranty	1 year
Dimensions (rack)	89 mm high × 435 mm wide × 549 mm deep (3.5 in × 17.1 in × 21.6 in)
Dimensions (bench, with handle and feet)	104 mm high × 483 mm wide × 620 mm deep (4.1 in × 19 in × 24.4 in)
Weight	9.98 kg (22 lbs)
Environment	For indoor use only
Calibration Period	One year

Important: Maximum output envelope: ±3000V at 20mA, ±1500V at 120mA, 180W total. Voltage source settling is typically <1 ms to 200V and <7 ms to 3000V.Important: The Model 8010 High Power Device Test Fixture is required for safe connections when testing packaged high power devices at up to 3000V or 100A; the 2657A-PM-200 Protection Module and 2657A-LIM-3 Low Interconnect Module are recommended when connecting multiple instruments to a probe station (not required when using the Model 8010).Important: Safety: ETL listed (PENDING) per the datasheet at time of publication. Conforms to European Union Low Voltage Directive.Important: For temperatures 0° to 18°C and 28° to 50°C, voltage accuracy is degraded by ±(0.15 × accuracy specification)/°C and current accuracy is degraded by ±(0.35 × accuracy specification)/°C.Recommended pairing: the Model 8010 High Power Device Test Fixture provides safe connections for testing packaged devices at up to 3000V or 100A and accepts the 2657A together with one or two Model 2651A high-current SourceMeter instruments and three additional Series 2600A or Model 4200-SCS SMU instruments, with full interlock for up to six SourceMeter instruments.

Please review the Manufacturer's Data Sheet to verify published specifications. Feedback on this webpage is always welcome — please reach out to your Test Architect at any time for questions or concerns. Thank you, we truly appreciate you being our customer.